Scanning Electron Microscope - SPECIFICATIONS Resolution   6.0nm(Tungsten filament) Magnification   15×～250,000× Electron Optical System Electron gun:Tungsten emitter Accelerating voltage:0-30kV Lens system:Three electron magnetic lens system Objective lens aperture:Three apertures selectable Specimen Chamber Six ports for WDS,EDS,BSE detectors and other attachment installation. Specimen Stage Standard stage Displacement:X and Y lateral motions 50mm,Z motion 25mm,tilt 5°, 90°,360°continuous rotation Large stage Displacement:X lateral motion 80mm,Y lateral motion 50mm,Z motion 30mm,tilt0°, 90°,360°continuous rotation Computer System PC compatible,microsoft™ Windows™ XP operation system Image Display Digital image,1024×768 frame and display resolution Scanning mode:Full frame,plane,line,spot,selected area dual magnification and screen split 17-inch colour viewing monitor Operate And Control Software The brand new design operate operate software,SEM control by using keyboard and mouse only.Versatile automatic function.Parameters of SEM operation can be stored and easily managed. Image Processing And Analyzing Image enhancement,Threshold transformation,particle statistic analysis,Morphology transformation,Gray level histogram display and pseudo-colour transform for gray scale image Image Output And Record Versatile image document formats,support digital monochrome printer and versatile print out equipment with standard interface Vacuum system Fully automatic high speed diffusion pump vacuum system(Turbomolecular pump optional)

Scanning Electron Microscope   - SPECIFICATION Resolution   4.5nm (Tungsten filament) Magnification   15×~250,000× Electron Optical System 1. Electron gun:Tungsten cathode 2. Accelerating voltage :0~30kV 3.Lens system :Three electron magnetic lens system 4.Objective lens aperture:Three apertures selectable   Specimen Chamber Six ports for WDS,EDS,BSE detectors and other attachment installation Specimen Stage 1. Standard Stage Displacement:X=50mm,Y=50mm,Z=25mm; T=-5°~+90°,R=360° 2. Large Stage Displacement:X=80mm,Y=50mm,Z=30mm;T=0° ~+90°,R=360° Computer System Microsoft™ Windows™ XP operation system Image Display Digital image,1024×768 frame and display resolution 17 LCD monitor Scanning Mode Plane,line and spot scan.Dual magnification and screen split Operate And Control Software The whole new operate software contributes to excellent convenience and easiness and easiness of SEM operation by using only mouse and keyboard.Parameters of SEM operation can be stored and easily managed. Image Processing And Analyzing 1. Image enhancement 2. Threshold transformation 3. Particle statistic analysis 4. Morphology transformation 5. Gray level histogram display 6. Pseudo-colour transform for gray scale image. Image Output And Record 1. Ultra high-resolution(2500 lines)scope for photographing 2. Versatile image document formats 3.support digital monochrome printer and versatile print-out equipments with standard interface Vacuum System Fully automatic high speed diffusion pump vacuum system (Turbomolecular pump optional)

Scanning Electron Microscope - Scanning Electron Microscope Combining decades of experience in SEM research and manufacture with the latest computer and digital image analysis technology , SEM-2000B has not only perfect reliability and quality of traditional SEM products,but also the most up-to-date automatic computer control function.With a special patented image processing system, SEM-2000B is an ideal combination of SEM technology and image analysis system.In the friendly operating environment of WindowXP you will enjoy the ease and convenience of getting test results and analysis data in versatile forms including picture,table and curve,etc.In addition,our professional,timely and considerable after-sale services have been praised by our dear customers. SPECIFICATION Resolution 4.5nm (Tungsten filament) Magnification 15×~250,000× Electron Optical System 1. Electron gun:Tungsten cathode 2. Accelerating voltage :0---30kV 3. Lens system :Three electron magnetic lens system 4. Objective lens aperture:Three apertures selectable Specimen Chamber Six ports for WDS,EDS,BSE detectors and other attachment installation Specimen Stage 1. Standard Stage Displacement: X=50mm,Y=50mm,Z=25mm; T=-5°~+90°,R=360° 2. Large Stage Displacement:X=80mm,Y=50mm,Z=30mm;T=0°~+90°,R=360° Computer System Microsoft™ Windows™ XP operation system Image Display Digital image,1024×768 frame and display resolution 17 CRT monitor Scanning Mode Plane,line and spot scan.Dual magnification and screen split Signal Processing And Operation Mode 1. Low pass filter 2. Automatic stigmatism 3. Image rotation 4. Automatic brightness and contrast 5. Dynamic focus 6. Compensated tilt Image Processing And Analyzing 1. Image enhancement 2. Threshold transformation 3. Particle statistic analysis 4. Morphology transformation 5. Gray level histogram display 6. Pseudo-colour transform for gray scale image. Image Output And Record 1. Ultra high-resolution(2500 lines)scope for photographing 2. Versatile image document formats 3. Support digital monochrome printer and versatile print-out equipments with standard interface Vacuum System Fully automatic high speed diffusion pump vacuum system (Turbomolecular pump optional)